SN74BCT8374ADWR Texas Instruments
Виробник: Texas InstrumentsDescription: IC SCAN TEST DEVICE W/FF 24-SOIC
Packaging: Tape & Reel (TR)
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-SOIC
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Технічний опис SN74BCT8374ADWR Texas Instruments
Description: IC SCAN TEST DEVICE W/FF 24-SOIC, Packaging: Tape & Reel (TR), Package / Case: 24-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-SOIC.