SN74BCT8374ANTG4 Texas Instruments
Виробник: Texas InstrumentsDescription: IC SCAN TEST DEVICE W/FF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
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Технічний опис SN74BCT8374ANTG4 Texas Instruments
Description: IC SCAN TEST DEVICE W/FF 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.