Продукція > EQUIP-TEST > SWT1005 CG07 M

SWT1005 CG07 M EQUIP-TEST

pVersion=0046&contRep=ZT&docId=005056AB281E1FD0AC9A6723326760E2&compId=SWT1005%20CG07%20M.pdf?ci_sign=8c3adc24e15c76610ff39f199c7d76b6865e40fd

Виробник: EQUIP-TEST
Category: Contact Probes
Description: Test needle; Spring compression: 4mm; 5mm; Min.pitch: 2.54mm; 3A
Type of test accessories: test needle
Operational spring compression: 4mm
Maksimum spring compression: 5mm
Minimum pitch: 2.54mm
Current rating: 3A
Contact material: beryllium copper
Contact plating: gold-plated
Tip diameter: 1.5mm
Blade tip shape: head CG
Max. contact resistance:: 30mΩ
Operating temperature: -40...80°C
Spring compression force: 1.35N
Overall length: 50.5mm

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Технічний опис SWT1005 CG07 M EQUIP-TEST

Category: Contact Probes, Description: Test needle; Spring compression: 4mm; 5mm; Min.pitch: 2.54mm; 3A, Type of test accessories: test needle, Operational spring compression: 4mm, Maksimum spring compression: 5mm, Minimum pitch: 2.54mm, Current rating: 3A, Contact material: beryllium copper, Contact plating: gold-plated, Tip diameter: 1.5mm, Blade tip shape: head CG, Max. contact resistance:: 30mΩ, Operating temperature: -40...80°C, Spring compression force: 1.35N, Overall length: 50.5mm.