1274AS-H-2R2N=P3 Murata Electronics
Виробник: Murata Electronics
Description: FIXED IND 2.2UH 8A 9.6 MOHM SMD
Current Rating (Amps): 8 A
Inductance: 2.2 µH
Part Status: Active
Height - Seated (Max): 0.197" (5.00mm)
Inductance Frequency - Test: 100 kHz
Material - Core: Ferrite
Current - Saturation (Isat): 12.6A
DC Resistance (DCR): 9.6mOhm Max
Type: Drum Core, Wirewound
Shielding: Shielded
Mounting Type: Surface Mount
Size / Dimension: 0.394" L x 0.394" W (10.00mm x 10.00mm)
Package / Case: Nonstandard
Tolerance: ±30%
Packaging: Cut Tape (CT)
| Кількість | Ціна |
|---|---|
| 4+ | 91.71 грн |
| 10+ | 68.31 грн |
| 25+ | 61.80 грн |
| 50+ | 53.75 грн |
| 100+ | 49.79 грн |
Відгуки про товар
Написати відгук
Технічний опис 1274AS-H-2R2N=P3 Murata Electronics
Description: FIXED IND 2.2UH 8A 9.6 MOHM SMD, Tolerance: ±30%, Packaging: Tape & Reel (TR), Package / Case: Nonstandard, Size / Dimension: 0.394" L x 0.394" W (10.00mm x 10.00mm), Mounting Type: Surface Mount, Shielding: Shielded, Type: Drum Core, Wirewound, DC Resistance (DCR): 9.6mOhm Max, Current - Saturation (Isat): 12.6A, Material - Core: Ferrite, Inductance Frequency - Test: 100 kHz, Height - Seated (Max): 0.197" (5.00mm), Part Status: Active, Inductance: 2.2 µH, Current Rating (Amps): 8 A.
Інші пропозиції 1274AS-H-2R2N=P3
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
|---|---|---|---|---|---|
|
|
1274AS-H-2R2N=P3 | Виробник : Murata Electronics |
Description: FIXED IND 2.2UH 8A 9.6 MOHM SMD Tolerance: ±30% Packaging: Tape & Reel (TR) Package / Case: Nonstandard Size / Dimension: 0.394" L x 0.394" W (10.00mm x 10.00mm) Mounting Type: Surface Mount Shielding: Shielded Type: Drum Core, Wirewound DC Resistance (DCR): 9.6mOhm Max Current - Saturation (Isat): 12.6A Material - Core: Ferrite Inductance Frequency - Test: 100 kHz Height - Seated (Max): 0.197" (5.00mm) Part Status: Active Inductance: 2.2 µH Current Rating (Amps): 8 A |
товару немає в наявності |
|
 |
1274AS-H-2R2N=P3 | Виробник : Murata Electronics |
Fixed Inductors |
товару немає в наявності |