C2220C226M3N2CAUTO KEMET
| Кількість | Ціна |
|---|---|
| 1+ | 418.11 грн |
| 10+ | 368.84 грн |
| 50+ | 279.59 грн |
| 100+ | 232.18 грн |
| 200+ | 205.68 грн |
| 400+ | 200.11 грн |
| 1000+ | 193.83 грн |
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Технічний опис C2220C226M3N2CAUTO KEMET
Description: CAP CER 22UF 25V X8L SMD, Packaging: Tape & Reel (TR), Tolerance: ±20%, Lead Style: J-Lead, Features: Low ESL (Stacked), High Temperature, Voltage - Rated: 25V, Package / Case: Stacked SMD, 2 J-Lead, Temperature Coefficient: X8L, Size / Dimension: 0.236" L x 0.197" W (6.00mm x 5.00mm), Mounting Type: Surface Mount, MLCC, Operating Temperature: -55°C ~ 150°C, Applications: Automotive, Bypass, Decoupling, Boardflex Sensitive, Ratings: AEC-Q200, Thickness (Max): 0.217" (5.50mm), Part Status: Active, Capacitance: 22 µF.
Інші пропозиції C2220C226M3N2CAUTO за ціною від 289.39 грн до 470.63 грн
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C2220C226M3N2CAUTO | Виробник : KEMET |
 Description: CAP CER 22UF 25V X8L SMDPackaging: Cut Tape (CT) Tolerance: ±20% Lead Style: J-Lead Features: Low ESL (Stacked), High Temperature Voltage - Rated: 25V Package / Case: Stacked SMD, 2 J-Lead Temperature Coefficient: X8L Size / Dimension: 0.236" L x 0.197" W (6.00mm x 5.00mm) Mounting Type: Surface Mount, MLCC Operating Temperature: -55°C ~ 150°C Applications: Automotive, Bypass, Decoupling, Boardflex Sensitive Ratings: AEC-Q200 Thickness (Max): 0.217" (5.50mm) Part Status: Active Capacitance: 22 µF |
на замовлення 114 шт: термін постачання 21-31 дні (днів) |
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C2220C226M3N2CAUTO | Виробник : KEMET |
Description: CAP CER 22UF 25V X8L SMD Packaging: Tape & Reel (TR) Tolerance: ±20% Lead Style: J-Lead Features: Low ESL (Stacked), High Temperature Voltage - Rated: 25V Package / Case: Stacked SMD, 2 J-Lead Temperature Coefficient: X8L Size / Dimension: 0.236" L x 0.197" W (6.00mm x 5.00mm) Mounting Type: Surface Mount, MLCC Operating Temperature: -55°C ~ 150°C Applications: Automotive, Bypass, Decoupling, Boardflex Sensitive Ratings: AEC-Q200 Thickness (Max): 0.217" (5.50mm) Part Status: Active Capacitance: 22 µF |
товару немає в наявності |