CKG45NX7R2A475M500JJ TDK
| Кількість | Ціна |
|---|---|
| 1+ | 344.65 грн |
| 10+ | 274.02 грн |
| 50+ | 204.84 грн |
| 100+ | 186.03 грн |
| 500+ | 137.95 грн |
| 1000+ | 128.20 грн |
| 2000+ | 124.02 грн |
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Технічний опис CKG45NX7R2A475M500JJ TDK
Description: CAP CER 4.7UF 100V X7R SMD, Capacitance: 4.7 µF, Part Status: Not For New Designs, Thickness (Max): 0.217" (5.50mm), Ratings: AEC-Q200, Applications: Automotive, SMPS Filtering, Bypass, Decoupling, Operating Temperature: -55°C ~ 125°C, Mounting Type: Surface Mount, MLCC, Size / Dimension: 0.197" L x 0.138" W (5.00mm x 3.50mm), Temperature Coefficient: X7R, Package / Case: Stacked SMD, 2 J-Lead, Voltage - Rated: 100V, Features: Low ESL (Stacked), Lead Style: J-Lead, Tolerance: ±20%, Packaging: Tape & Reel (TR).
Інші пропозиції CKG45NX7R2A475M500JJ
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
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CKG45NX7R2A475M500JJ | Виробник : TDK Corporation |
 Description: CAP CER 4.7UF 100V X7R SMDCapacitance: 4.7 µF Part Status: Not For New Designs Thickness (Max): 0.217" (5.50mm) Ratings: AEC-Q200 Applications: Automotive, SMPS Filtering, Bypass, Decoupling Operating Temperature: -55°C ~ 125°C Mounting Type: Surface Mount, MLCC Size / Dimension: 0.197" L x 0.138" W (5.00mm x 3.50mm) Temperature Coefficient: X7R Package / Case: Stacked SMD, 2 J-Lead Voltage - Rated: 100V Features: Low ESL (Stacked) Lead Style: J-Lead Tolerance: ±20% Packaging: Cut Tape (CT) |
товару немає в наявності |
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CKG45NX7R2A475M500JJ | Виробник : TDK Corporation |
Description: CAP CER 4.7UF 100V X7R SMD Capacitance: 4.7 µF Part Status: Not For New Designs Thickness (Max): 0.217" (5.50mm) Ratings: AEC-Q200 Applications: Automotive, SMPS Filtering, Bypass, Decoupling Operating Temperature: -55°C ~ 125°C Mounting Type: Surface Mount, MLCC Size / Dimension: 0.197" L x 0.138" W (5.00mm x 3.50mm) Temperature Coefficient: X7R Package / Case: Stacked SMD, 2 J-Lead Voltage - Rated: 100V Features: Low ESL (Stacked) Lead Style: J-Lead Tolerance: ±20% Packaging: Tape & Reel (TR) |
товару немає в наявності |