MWLA0503S-3R3MT Shenzhen Sunlord Electronics Co., Ltd.
Виробник: Shenzhen Sunlord Electronics Co., Ltd.Description: FIXED IND 3.3UH 38MOHM 8000MA
Tolerance: ±20%
Packaging: Cut Tape (CT)
Package / Case: Nonstandard
Size / Dimension: 0.224" L x 0.205" W (5.70mm x 5.20mm)
Mounting Type: Surface Mount
Shielding: Shielded
Type: Drum Core, Wirewound
Operating Temperature: -55°C ~ 125°C
DC Resistance (DCR): 38mOhm Max
Current - Saturation (Isat): 8A
Material - Core: Carbonyl Powder
Inductance Frequency - Test: 100 kHz
Height - Seated (Max): 0.118" (3.00mm)
Part Status: Active
Inductance: 3.3 µH
Current Rating (Amps): 5 A
на замовлення 1985 шт:
термін постачання 21-31 дні (днів)
| Кількість | Ціна |
|---|---|
| 6+ | 61.92 грн |
| 10+ | 49.16 грн |
| 100+ | 40.46 грн |
| 1000+ | 31.24 грн |
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Технічний опис MWLA0503S-3R3MT Shenzhen Sunlord Electronics Co., Ltd.
Description: FIXED IND 3.3UH 38MOHM 8000MA, Tolerance: ±20%, Packaging: Tape & Reel (TR), Package / Case: Nonstandard, Size / Dimension: 0.224" L x 0.205" W (5.70mm x 5.20mm), Mounting Type: Surface Mount, Shielding: Shielded, Type: Drum Core, Wirewound, Operating Temperature: -55°C ~ 125°C, DC Resistance (DCR): 38mOhm Max, Current - Saturation (Isat): 8A, Material - Core: Carbonyl Powder, Inductance Frequency - Test: 100 kHz, Height - Seated (Max): 0.118" (3.00mm), Part Status: Active, Inductance: 3.3 µH, Current Rating (Amps): 5 A.
Інші пропозиції MWLA0503S-3R3MT
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MWLA0503S-3R3MT | Виробник : Shenzhen Sunlord Electronics Co., Ltd. |
Description: FIXED IND 3.3UH 38MOHM 8000MA Tolerance: ±20% Packaging: Tape & Reel (TR) Package / Case: Nonstandard Size / Dimension: 0.224" L x 0.205" W (5.70mm x 5.20mm) Mounting Type: Surface Mount Shielding: Shielded Type: Drum Core, Wirewound Operating Temperature: -55°C ~ 125°C DC Resistance (DCR): 38mOhm Max Current - Saturation (Isat): 8A Material - Core: Carbonyl Powder Inductance Frequency - Test: 100 kHz Height - Seated (Max): 0.118" (3.00mm) Part Status: Active Inductance: 3.3 µH Current Rating (Amps): 5 A |
товару немає в наявності |