PLF1A561MDO1TD Nichicon
| Кількість | Ціна |
|---|---|
| 3+ | 122.74 грн |
| 10+ | 61.37 грн |
| 100+ | 48.56 грн |
| 500+ | 40.27 грн |
| 1000+ | 36.30 грн |
| 2500+ | 34.00 грн |
| 5000+ | 33.16 грн |
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Технічний опис PLF1A561MDO1TD Nichicon
Description: CAP ALUM POLY 560UF 20% 10V T/H, Tolerance: ±20%, Packaging: Tape & Box (TB), Package / Case: Radial, Can, Size / Dimension: 0.394" Dia (10.00mm), Mounting Type: Through Hole, Type: Polymer, Operating Temperature: -55°C ~ 105°C, Applications: General Purpose, Lead Spacing: 0.197" (5.00mm), ESR (Equivalent Series Resistance): 7mOhm, Lifetime @ Temp.: 2000 Hrs @ 105°C, Height - Seated (Max): 0.512" (13.00mm), Part Status: Active, Capacitance: 560 µF, Voltage - Rated: 10 V, Ripple Current @ High Frequency: 5.9 A @ 100 kHz.
Інші пропозиції PLF1A561MDO1TD за ціною від 95.47 грн до 145.01 грн
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PLF1A561MDO1TD | Виробник : Nichicon |
 Description: CAP ALUM POLY 560UF 20% 10V T/HRipple Current @ High Frequency: 5.9 A @ 100 kHz Voltage - Rated: 10 V Capacitance: 560 µF Part Status: Active Height - Seated (Max): 0.512" (13.00mm) Lifetime @ Temp.: 2000 Hrs @ 105°C ESR (Equivalent Series Resistance): 7mOhm Lead Spacing: 0.197" (5.00mm) Applications: General Purpose Operating Temperature: -55°C ~ 105°C Type: Polymer Mounting Type: Through Hole Size / Dimension: 0.394" Dia (10.00mm) Package / Case: Radial, Can Tolerance: ±20% Packaging: Cut Tape (CT) |
на замовлення 72 шт: термін постачання 21-31 дні (днів) |
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PLF1A561MDO1TD | Виробник : Nichicon |
Description: CAP ALUM POLY 560UF 20% 10V T/H Tolerance: ±20% Packaging: Tape & Box (TB) Package / Case: Radial, Can Size / Dimension: 0.394" Dia (10.00mm) Mounting Type: Through Hole Type: Polymer Operating Temperature: -55°C ~ 105°C Applications: General Purpose Lead Spacing: 0.197" (5.00mm) ESR (Equivalent Series Resistance): 7mOhm Lifetime @ Temp.: 2000 Hrs @ 105°C Height - Seated (Max): 0.512" (13.00mm) Part Status: Active Capacitance: 560 µF Voltage - Rated: 10 V Ripple Current @ High Frequency: 5.9 A @ 100 kHz |
товару немає в наявності |