SN74BCT8240ANT Texas Instruments
Виробник: Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Supplier Device Package: 24-PDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with Inverting Buffers
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-DIP (0.300", 7.62mm)
Packaging: Tube
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Технічний опис SN74BCT8240ANT Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP, Supplier Device Package: 24-PDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with Inverting Buffers, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-DIP (0.300", 7.62mm), Packaging: Tube.
Інші пропозиції SN74BCT8240ANT
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
|---|---|---|---|---|---|
|
|
SN74BCT8240ANT | Texas Instruments |
Description: IC SCAN TEST DEVICE BUFF 24-DIP Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Inverting Buffers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
товару немає в наявності |
Мінімальне замовлення: 60 шт В кошику од. на суму грн. |
| SN74BCT8240ANT |
|
Виробник: Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
товару немає в наявності
Мінімальне замовлення: 60 шт
В кошику
од. на суму грн.