Технічний опис SNJ54ABT8652JT TI
Description: SCAN TEST DEVICES WITH OCTAL BUS, Packaging: Tube, Package / Case: 28-CDIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Bus Transceiver and Registers, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-CDIP.
Інші пропозиції SNJ54ABT8652JT
| Фото | Назва | Виробник | Інформація | Доступність | Ціна без ПДВ |
|---|---|---|---|---|---|
 |
SNJ54ABT8652JT | Texas Instruments |
Description: SCAN TEST DEVICES WITH OCTAL BUS Packaging: Tube Package / Case: 28-CDIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceiver and Registers Operating Temperature: -55°C ~ 125°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-CDIP |
товару немає в наявності |
В кошику од. на суму грн. |
| SNJ54ABT8652JT |
Виробник: Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL BUS
Packaging: Tube
Package / Case: 28-CDIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceiver and Registers
Operating Temperature: -55°C ~ 125°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-CDIP
Description: SCAN TEST DEVICES WITH OCTAL BUS
Packaging: Tube
Package / Case: 28-CDIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceiver and Registers
Operating Temperature: -55°C ~ 125°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-CDIP
товару немає в наявності
В кошику
од. на суму грн.