Технічний опис SNJ54BCT8244AJT N
Description: SCAN TEST DEVICES WITH OCTAL BUF, Packaging: Tube, Package / Case: 24-CDIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Buffers, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-CDIP.
Інші пропозиції SNJ54BCT8244AJT
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
|---|---|---|---|---|---|
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SNJ54BCT8244AJT | Виробник : Texas Instruments |
 Description: SCAN TEST DEVICES WITH OCTAL BUFPackaging: Tube Package / Case: 24-CDIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Buffers Operating Temperature: -55°C ~ 125°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-CDIP |
товару немає в наявності |