Технічний опис SNJ54BCT8374AJT TI
Description: SCAN TEST DEVICES WITH OCTAL D-T, Supplier Device Package: 24-CDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: -55°C ~ 125°C, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-CDIP (0.300", 7.62mm), Packaging: Tube.
Інші пропозиції SNJ54BCT8374AJT
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
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SNJ54BCT8374AJT | Виробник : Texas Instruments |
 Description: SCAN TEST DEVICES WITH OCTAL D-TSupplier Device Package: 24-CDIP Supply Voltage: 4.5V ~ 5.5V Operating Temperature: -55°C ~ 125°C Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Number of Bits: 8 Mounting Type: Through Hole Package / Case: 24-CDIP (0.300", 7.62mm) Packaging: Tube |
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