UMJ325AB7475MMHP Taiyo Yuden
Виробник: Taiyo YudenDescription: CAP CER 4.7UF 50V X7R 1210
Packaging: Cut Tape (CT)
Tolerance: ±20%
Features: Soft Termination
Voltage - Rated: 50V
Package / Case: 1210 (3225 Metric)
Temperature Coefficient: X7R
Size / Dimension: 0.126" L x 0.098" W (3.20mm x 2.50mm)
Mounting Type: Surface Mount, MLCC
Operating Temperature: -55°C ~ 125°C
Applications: Automotive, SMPS Filtering, Boardflex Sensitive
Ratings: AEC-Q200
Thickness (Max): 0.110" (2.80mm)
Capacitance: 4.7 µF
на замовлення 136 шт:
термін постачання 21-31 дні (днів)
| Кількість | Ціна |
|---|---|
| 5+ | 73.04 грн |
| 10+ | 43.58 грн |
| 50+ | 32.70 грн |
| 100+ | 27.49 грн |
Відгуки про товар
Написати відгук
Технічний опис UMJ325AB7475MMHP Taiyo Yuden
Description: CAP CER 4.7UF 50V X7R 1210, Packaging: Tape & Reel (TR), Tolerance: ±20%, Features: Soft Termination, Voltage - Rated: 50V, Package / Case: 1210 (3225 Metric), Temperature Coefficient: X7R, Size / Dimension: 0.126" L x 0.098" W (3.20mm x 2.50mm), Mounting Type: Surface Mount, MLCC, Operating Temperature: -55°C ~ 125°C, Applications: Automotive, SMPS Filtering, Boardflex Sensitive, Ratings: AEC-Q200, Thickness (Max): 0.110" (2.80mm), Capacitance: 4.7 µF.
Інші пропозиції UMJ325AB7475MMHP
| Фото | Назва | Виробник | Інформація |
Доступність |
Ціна |
|---|---|---|---|---|---|
|
|
UMJ325AB7475MMHP | Виробник : Taiyo Yuden |
Description: CAP CER 4.7UF 50V X7R 1210 Packaging: Tape & Reel (TR) Tolerance: ±20% Features: Soft Termination Voltage - Rated: 50V Package / Case: 1210 (3225 Metric) Temperature Coefficient: X7R Size / Dimension: 0.126" L x 0.098" W (3.20mm x 2.50mm) Mounting Type: Surface Mount, MLCC Operating Temperature: -55°C ~ 125°C Applications: Automotive, SMPS Filtering, Boardflex Sensitive Ratings: AEC-Q200 Thickness (Max): 0.110" (2.80mm) Capacitance: 4.7 µF |
товару немає в наявності |
|
 |
UMJ325AB7475MMHP | Виробник : Taiyo Yuden |
Multilayer Ceramic Capacitors MLCC - SMD/SMT 963-MCJCU32MAB7475MP RPLCMT PN 50V 4.7uF X7R 1210 AEC-Q200 |
товару немає в наявності |